Radiation Events

Under Construction

This page is a stub and still under construction. Details may be incomplete or change.

Radiation in LEO can affect the OBC and payload electronics. PEROVSAT focuses mitigation on effects that matter for a short ISS-orbit mission with expected shielding.

Cumulative effects (likely negligible for us)

Effect	Concern for PEROVSAT
Total Ionizing Dose (TID)	Low expected dose over mission life with shielding
Displacement Damage (DD)	Some PV degradation possible; MOS logic in the OBC is relatively insensitive

These are monitored at the mission level but are not primary software FDIR drivers.

Single Event Effects (SEEs)

These drive software and hardware FDIR design:

Effect	Symptom	Mitigation direction
SET (transient)	Glitches on signal paths	Watchdogs, reset
SEU (bit flip)	Corrupted SRAM / state	Boot from flash, ECC, variable duplication, memory scrubbing
SEL (latch-up)	Destructive high current	Hardware LCL / overcurrent protection on power rails

Open questions

• SD card / NOR storage FDIR details are still being defined (see design-and-planning exploration/sd.md).